Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/31513
Title: Comprehensive study of pulsed UV-laser modified polyamide fibers
Authors: Yip, J
Chan, K
Sin, KM
Lau, KS
Keywords: High-fluence
Low-fluence
Polyamide
Pulsed UV-laser
Surface modification
Issue Date: 2003
Publisher: Springer-Verlag
Source: Materials research innovations, 2003, v. 7, no. 5, p. 302-307 How to cite?
Journal: Materials Research Innovations 
Abstract: Polyamide fibers (nylon 6) are modified by UV-radiation using a pulsed excimer laser with different treatment parameters. The treated samples are characterized by using a scanning electron microscopy (SEM), tapping mode atomic force microscopy (TM-AFM), x-ray photoelectron spectroscopy (XPS), and chemical force microscopy (CFM). Depending on the conditions during the irradiation, different surface modifications are obtained which can generally be distinguished as high-fluence (above the ablation threshold) and low-fluence (below the ablation threshold). Topographical results indicate that ripple-like structures of micrometer size are developed under high-fluence laser irradiation. On the contrary, smaller sub-micron structures are formed by low-fluence treatment. XPS results show that bond scission occurs on the polymer surface under the action of high-fluence while low-fluence modifies the sample by an oxidative process. Changes in surface chemical properties of the laser-irradiated polyamide are supported by chemical force microscopy experiments with gold-coated AFM tips modified with -COOH terminated self-assembled alkanethiol monolayers (SAMs).
URI: http://hdl.handle.net/10397/31513
ISSN: 1432-8917
DOI: 10.1007/s10019-003-0268-9
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