Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/31111
Title: Optical degradation of indium tin oxide thin films induced by hydrogen-related room temperature reduction
Authors: Wang, Y 
Chen, WP
Cheng, KC
Chan, HLW 
Choy, CL 
Keywords: Electrolysis of water
Indium tin oxide
Optical film
Reduction
Transparency
Issue Date: 2003
Publisher: Institute of Pure and Applied Physics
Source: Japanese journal of applied physics. Part 2, Letters, 2003, v. 42, no. 5 B, p. L546-L548 How to cite?
Journal: Japanese journal of applied physics. Part 2, Letters 
Abstract: The optical degradation of indium tin oxide (ITO) thin films due to a hydrogen-related room temperature reduction reaction was reported. The thin films were treated in an electrolysis process. Significant decrease in the optical transmission of the treated samples was observed. Compositional and structural changes in ITO caused by the reaction related to atomic hydrogen generated in the electrolysis of water was found to be responsible for the degradation. X-ray diffraction and scanning electron microcopy (SEM) observations were employed in the analysis of the products yielded in the reduction reaction.
URI: http://hdl.handle.net/10397/31111
ISSN: 0021-4922
EISSN: 1347-4065
DOI: 10.1143/JJAP.42.L546
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

3
Last Week
0
Last month
0
Citations as of Aug 13, 2017

WEB OF SCIENCETM
Citations

4
Last Week
0
Last month
0
Citations as of Aug 12, 2017

Page view(s)

47
Last Week
2
Last month
Checked on Aug 13, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.