Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/30999
Title: Development of a micro-beam method to investigate the fatigue crack growth mechanisms of submicron-scale cracks
Authors: Yang, Y
Ruan, HH
Lu, J
Yao, N
Shan, WL
Soboyejo, WO
Keywords: Fatigue
Fatigue tests
Focused ion beam (FIB)
Steels
Issue Date: 2009
Publisher: Springer
Source: Experimental mechanics, 2009, v. 49, no. 5, p. 731-742 How to cite?
Journal: Experimental Mechanics 
Abstract: In this paper, we propose a new experimental method to investigate the fatigue crack growth mechanisms of submicron-scale cracks by using freestanding single edge notched micro-beams that are fabricated on the surfaces of conventional bending specimens with the focused ion beam technique. Three dimensional FEM simulations in conjugate with LEFM fracture analysis were carried out to correlate the applied far field stresses with the local crack-tip driving force. For the validation of the new method, micro-beam experiments were conducted on 4340 low alloy steels and the results showed the similar findings compared to those in the literature while revealed undiscovered fatigue damage mechanisms that took place at the submicron and nanometer scales.
URI: http://hdl.handle.net/10397/30999
DOI: 10.1007/s11340-008-9180-y
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