Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/30825
Title: Optical studies of 0.65PbMg1/3Nb2/3O3 -0.35PbTiO3 thin films
Authors: Chan, KY
Tsang, WS
Mak, CL 
Wong, KH
Keywords: Films
Optical properties
Pulsed laser deposition
Titanates
Issue Date: 2005
Source: Journal of the European ceramic society, 2005, v. 25, no. 12 spec. iss., p. 2313-2317 How to cite?
Journal: Journal of the European Ceramic Society 
Abstract: 0.65PbMg1/3Nb2/3O3-0.35PbTiO3 (PMN-PT) thin films with different deposition temperatures were fabricated on (0 0 1)MgO single crystal substrates using pulsed laser deposition (PLD). X-ray diffraction (XRD) showed that the films are epitaxially grown on (0 0 1)MgO substrates. Spectroscopic ellipsometer (SE) was used to characterize the optical properties including refractive indices as well as extinction coefficients of these PMN-PT films in energy range of 0.75-3.5 eV. By fitting the measured ellipsometeric spectra, film thicknesses, surface roughness and optical properties were derived for all PMN-PT films. The film thickness and surface roughness obtained by SE were consistent with those measured by scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively. The optical band gap energies of PMN-PT films were deduced from the obtained extinction coefficients using Tauc equation. These values were comparable to those obtained by optical transmittance measurements. Our analysis revealed that the optimum refractive index emerges as the film fabricated at ∼670 °C.
URI: http://hdl.handle.net/10397/30825
ISSN: 0955-2219
DOI: 10.1016/j.jeurceramsoc.2005.03.063
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