Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/30577
Title: Characterization of 90° domain structure and polarization switching in Pb(Zr0.4Ti0.6)O3 film by piezoresponse force microscope
Authors: Zhao, X
Dai, JY 
Tang, XG
Wang, J
Chan, HLW 
Choy, CL 
Issue Date: 2005
Publisher: Springer
Source: Applied physics. A, Materials science & processing, 2005, v. 81, no. 5, p. 997-1000 How to cite?
Journal: Applied physics. A, Materials science & processing 
Abstract: A lead zirconate titanate Pb(Zr0.4Ti0.6)O 3 (PZT40/60) film was deposited on a Pt(111)/Ti/SiO 2/Si(100) substrate by a sol-gel process followed by thermal annealing at 650 °C for 5 min. Piezoresponse force microscope observation revealed a lamellar domain structure in the PZT40/60 grains and we attribute the lamellar domains as 90° ferroelectric domains. The polarization-switching mechanism of the 90° domains in the PZT40/60 film under external electric fields has also been studied and it was revealed that a large-area polarization switching is usually accompanied by the appearance of a new direction of 90° domains in order to reduce the stress in the grains. By contrast, a nanometer-sized polarization switching is believed to be accomplished by generating 180° domains within a single lamellar domain.
URI: http://hdl.handle.net/10397/30577
ISSN: 0947-8396
EISSN: 1432-0630
DOI: 10.1007/s00339-004-2977-3
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