Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/29930
Title: Epitaxial growth and dielectric properties of BSZT thin films on SrTiO3 : NB single crystal substrate prepared by pulsed laser deposition
Authors: Jiang, LL
Tang, XG
Jiang, YP
Liu, QX
Ma, CB
Chan, HLW 
Keywords: BSZT
Dielectric properties
Electric field
Pulsed laser deposition
Thin films
Tunability
Issue Date: 2013
Publisher: Elsevier
Source: Surface and coatings technology, 2013, v. 229, p. 162-164 How to cite?
Journal: Surface and coatings technology 
Abstract: The (Ba0.75Sr0.25)(Zr0.25Ti0.75)O3 (BSZT) thin films were grown on (100) SrTiO3:1.0wt.% Nb single crystal substrates by pulsed laser deposition. Highly (001)-oriented BSZT films were achieved. The thickness of as-grown thin films was measured by a surface profiler and was found to be ~600nm. The crystalline structure of the BSZT thin films on (100) SrTiO3:Nb substrate was analyzed by an X-ray diffractometer (XRD). The surface morphology and roughness were determined by an atomic force microscopy (AFM) using tapping mode amplitude modulation. The films exhibited a clustered grains characteristic of the grains with size of 80-120nm. The dielectric properties of Pt/BSZT/SrTiO3:Nb capacitors were measured by using an Agilent 4294A impedance analyzers at room temperature. The dielectric constant of BSZT film changes significantly with applied dc bias field and has a high tunability of ~44% at an applied field of 600kV/cm.
URI: http://hdl.handle.net/10397/29930
ISSN: 0257-8972
EISSN: 1879-3347
DOI: 10.1016/j.surfcoat.2012.07.014
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