Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/29346
Title: Physics-of-failure-based prognostics and health management for high-power white light-emitting diode lighting
Authors: Fan, J
Yung, KC 
Pecht, M
Keywords: Light-emitting diode (LED) lighting
physics-of-failure
prognostics and health management (PHM)
Issue Date: 2011
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE transactions on device and materials reliability, 2011, v. 11, no. 3, 5773483, p. 407-416 How to cite?
Journal: IEEE transactions on device and materials reliability 
Abstract: Recently, high-power white light-emitting diodes (LEDs) have attracted much attention due to their versatility in applications and to the increasing market demand for them. So great attention has been focused on producing highly reliable LED lighting. How to accurately predict the reliability of LED lighting is emerging as one of the key issues in this field. Physics-of-failure-based prognostics and health management (PoF-based PHM) is an approach that utilizes knowledge of a product's life cycle loading and failure mechanisms to design for and assess reliability. In this paper, after analyzing the materials and geometries for high-power white LED lighting at all levels, i.e., chips, packages and systems, failure modes, mechanisms and effects analysis (FMMEA) was used in the PoF-based PHM approach to identify and rank the potential failures emerging from the design process. The second step in this paper was to establish the appropriate PoF-based damage models for identified failure mechanisms that carry a high risk.
URI: http://hdl.handle.net/10397/29346
ISSN: 1530-4388 (print)
1558-2574 (online)
DOI: 10.1109/TDMR.2011.2157695
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