Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/28872
Title: Pulsed laser deposition of Ba0.6Sr0.4TiO3 thin films and their optical properties
Authors: Wang, DY
Wang, Y 
Wong, KH
Lor, KP
Chan, HP
Chiang, KS
Chan, HLW 
Choy, CL
Keywords: BST thin films
Electro-optic
Ellipsometer
Prism coupler
Pulsed laser deposition
Issue Date: 2005
Publisher: Taylor & Francis Ltd
Source: Integrated ferroelectrics, 2005, v. 69, p. 443-451 How to cite?
Journal: Integrated Ferroelectrics 
Abstract: Barium strontium titanate [Ba0.6Sr0.4TiO3 or BST (60/40)] thin films were deposited on MgO (100) substrates using pulsed laser deposition. X-ray diffraction (XRD) measurements revealed that the BST thin films had epitaxially grown on the MgO (100) substrates. The surface morphology of the thin films was observed using an atomic force microscope and the grain size was found to be about 100-150 nm. The surface roughness was around 4.9 nm for a 250 nm thick film. The optical transmittance of the BST thin film was measured using a transmission mode ellipsometer. The BST/MgO configuration was highly transparent in the visible region. The optical band gap energy of the BST film, calculated by applying the Taue relation, was 3.56 eV. Optical waveguide characteristics of the BST (60/40) thin film were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BST film exhibited a predominately quadratic E-O behavior and the quadratic E-O coefficient was found to be 0.58 × 10-17 m2/V2.
Description: 16th International Symposium on Integrated Ferroelectrics, ISIF-16, Gyeongju, 5-8 April 2004
URI: http://hdl.handle.net/10397/28872
ISSN: 1058-4587
DOI: 10.1080/10584580590909836
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