Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/28299
Title: Reflectometry measuring refractive index and thickness of polymer samples simultaneously
Authors: Wang, YP
Wang, DN 
Jin, W 
Chen, JP
Li, XW
Zhou, JH
Issue Date: 2006
Publisher: Taylor & Francis Ltd
Source: Journal of modern optics, 2006, v. 53, no. 13, p. 1845-1851 How to cite?
Journal: Journal of Modern Optics 
Abstract: It is proposed and demonstrated that a novel reflectometry based on the Michelson interference measures simultaneously group refractive index and thickness of polymer samples. Such a reflectometry is a contactless measurement technique, and no damage occurs to the sample measured. Moreover, the measurement error of refractive index decreases linearly with the increasing measured sample's thickness. The ingenious planar polymer sample fabricated acts as not only the measured sample but also the fixed mirror that is necessary in other Michelson interference systems, which simplify the measurement configuration. Our reflectometry exhibits some advantages, such as simple measurement configuration, straightforward principle, easy operation, contactless measurement and high measurement precision.
URI: http://hdl.handle.net/10397/28299
ISSN: 0950-0340
DOI: 10.1080/09500340600654764
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