Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/27675
Title: Optimal thresholds for multiwavelet shrinkage
Authors: Hsung, TC
Lun, DPK 
Issue Date: 2003
Publisher: Institution of Engineering and Technology
Source: Electronics letters, 2003, v. 39, no. 5, p. 473-474 How to cite?
Journal: Electronics letters 
Abstract: Optimal threshold selection for multiwavelet denoising using multivariate shrinkage was discussed. A new risk estimator for each decomposition level based on the principle of Stein's unbiased risk estimator was presented. It was found that multiwavelet denoising with multivariate shrinkage gives consistently better results than using wavelet shrinkage.
URI: http://hdl.handle.net/10397/27675
ISSN: 0013-5194
EISSN: 1350-911X
DOI: 10.1049/el:20030328
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

5
Last Week
0
Last month
0
Citations as of Aug 14, 2017

WEB OF SCIENCETM
Citations

4
Last Week
0
Last month
0
Citations as of Aug 13, 2017

Page view(s)

28
Last Week
2
Last month
Checked on Aug 13, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.