Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/27071
Title: New scheme for complete cancellation of charge injection distortion in second generation switched-current circuits
Authors: Zeng, X
Tse, CK 
Tang, PS
Issue Date: 1995
Publisher: IEEE
Source: IEEE Region 10 Annual International Conference, Proceedings/TENCON, 1995, p. 127-130 How to cite?
Abstract: This paper begins with an analysis of the charge injection error in the second-generation current memory cell. By combining the circuit-replication technique and the n-step principle, a new scheme for simultaneously cancelling both signal-dependent and signal-independent charge injection errors in second-generation switched-current circuits is proposed. SPICE simulations are used to verify the feasibility and effectiveness of the proposed cell for tackling the charge injection problem. Major merits of the proposed cell include capability to meet high precision requirements and applicability to any second-generation switched-current circuit configuration.
Description: Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95, Hong Kong, Hong Kong, 6-10 November 1995
URI: http://hdl.handle.net/10397/27071
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