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Title: Surface morphology and chemical composition of nano-treated materials
Authors: Wong, YW
Yuen, CWM
Leung, MYS
Lam, HLI
Chung, YSS
Issue Date: 2005
Source: Textile Asia, 2005, v. 36, no. 4, p. 45-48
Abstract: The characterization of nanoparticles and nano-treated materials in terms of their surface morphology and chemical composition, by using common instrumental techniques, is important for understanding their behavior and properties. One such technique, scanning electron microscope (SEM), measures two dimensions of the samples and resolves surface structure down to the nanometer. It also provides elemental analysis of the compositional information of the samples, known as Energy Dispersive X-ray (EDX) analysis. Another technique, scanning tunnelling microscope (STM), provides images with atomic resolution and is used to investigate the surface of carbon fiber owing to its flat and conductive surface. Atomic force microscopy (AFM) is widely used to investigate the topography of nano-treated materials and provides a three-dimensional image of the nano-particles attached on the surface of samples without damaging the sample. Transmission electron microscopy (TEM) is found to be unique as it can provide a real space image on the atom distribution in the nano-crystal and on its surface. X-ray photoelectron spectroscopy (XPS) and Fourier Transforms infrared (FTIR) spectroscopy are used specifically for analyzing the chemical compositions and chemical bonding respectively.
Publisher: Business Press Ltd
Journal: Textile Asia 
ISSN: 0049-3554
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