Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/27067
Title: Surface morphology and chemical composition of nano-treated materials
Authors: Wong, YW
Yuen, CWM
Leung, MYS
Ku, SKA
Lam, HLI
Chung, YSS
Issue Date: 2005
Publisher: Business Press Ltd
Source: Textile Asia, 2005, v. 36, no. 4, p. 45-48 How to cite?
Journal: Textile Asia 
Abstract: The characterization of nanoparticles and nano-treated materials in terms of their surface morphology and chemical composition, by using common instrumental techniques, is important for understanding their behavior and properties. One such technique, scanning electron microscope (SEM), measures two dimensions of the samples and resolves surface structure down to the nanometer. It also provides elemental analysis of the compositional information of the samples, known as Energy Dispersive X-ray (EDX) analysis. Another technique, scanning tunnelling microscope (STM), provides images with atomic resolution and is used to investigate the surface of carbon fiber owing to its flat and conductive surface. Atomic force microscopy (AFM) is widely used to investigate the topography of nano-treated materials and provides a three-dimensional image of the nano-particles attached on the surface of samples without damaging the sample. Transmission electron microscopy (TEM) is found to be unique as it can provide a real space image on the atom distribution in the nano-crystal and on its surface. X-ray photoelectron spectroscopy (XPS) and Fourier Transforms infrared (FTIR) spectroscopy are used specifically for analyzing the chemical compositions and chemical bonding respectively.
URI: http://hdl.handle.net/10397/27067
ISSN: 0049-3554
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

Page view(s)

30
Last Week
4
Last month
Checked on Aug 13, 2017

Google ScholarTM

Check



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.