Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/26695
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dc.contributorDepartment of Applied Physics-
dc.creatorZheng, M-
dc.creatorLi, XY-
dc.creatorYang, MM-
dc.creatorZhu, QX-
dc.creatorWang, Y-
dc.creatorLi, XM-
dc.creatorShi, X-
dc.creatorChan, HLW-
dc.creatorLi, XG-
dc.creatorLuo, HS-
dc.creatorZheng, RK-
dc.date.accessioned2014-12-19T07:01:00Z-
dc.date.available2014-12-19T07:01:00Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/26695-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2013 AIP Publishing LLC.en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in M. Zheng et al., Appl. Phys. Lett. 103, 263507 (2013) and may be found at https://dx.doi.org/10.1063/1.4860415en_US
dc.titleCoupling of magnetic field and lattice strain and its impact on electronic phase separation in La0.335Pr0.335Ca 0.33MnO3/ferroelectric crystal heterostructuresen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume103-
dc.identifier.issue26-
dc.identifier.doi10.1063/1.4860415-
dcterms.abstractPhase-separated La0.335Pr0.335Ca 0.33MnO3 films were epitaxially grown on (001)- and (111)-oriented ferroelectric single-crystal substrates. Upon poling along the [001] or [111] direction, dramatic decrease in resistance, up to 99.98%, and complete melting of the charge-ordered phase were observed, caused by poling-induced strain rather than accumulation of electrostatic charge at interface. Such poling-induced strain effects can be effectively tuned by a magnetic field and mediated by electronic phase separation. In particular, our findings show that the evolution of the strength of electronic phase separation against temperature and magnetic field can be determined by measuring the strain-tunability of resistance [(Δ R / R) s t r a i n] under magnetic fields.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2013, v. 103, no. 26, 263507, p. 263507-1-263507-5-
dcterms.isPartOfApplied physics letters-
dcterms.issued2013-
dc.identifier.scopus2-s2.0-84891601921-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr69731-
dc.description.ros2013-2014 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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