Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/25836
Title: Determining Young's modulus of conductive thin films by a thermal bend beam test
Authors: Shen, W
Tang, CY 
Li, W
Peng, LH
Keywords: Conductive thin film
Electrothermal effect
Strain response
Thermal bend test
Young's modulus
Issue Date: 2001
Publisher: Professional Engineering Publishing Ltd
Source: Journal of strain analysis for engineering design, 2001, v. 36, no. 2, p. 163-168 How to cite?
Journal: Journal of Strain Analysis for Engineering Design 
Abstract: An experimental method used to measure the Young's modulus of the conductive thin film is proposed in this paper. This technology has utilized the electrothermal effect and strain response of conductive thin film coatings on glass substrates. On the basis of the thermo-elastic analysis of composite mechanics, the measurement principle and corresponding formula are given. The Young's modulus of conductive SnO2 thin film has been estimated by means of the formula and the thermal bend beam test presented.
URI: http://hdl.handle.net/10397/25836
ISSN: 0309-3247
DOI: 10.1243/0309324011512711
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