Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/25611
Title: On optical phase shift profilometry based on dual tree complex wavelet transform
Authors: Hsung, TC
Lun, DPK 
Keywords: Dual tree complex wavelet transform
Phase unwrapping
Profilometry
Issue Date: 2010
Publisher: IEEE
Source: 2010 17th IEEE International Conference on Image Processing (ICIP), 26-29 September 2010, Hong Kong, p. 337-340 How to cite?
Abstract: In optical phase shift profilometry, parallel fringe patterns are projected onto an object and the deformed fringes are captured using a digital camera. It is of particular interest because it enables reconstruction of the 3D shape of the object using just a few image captures, which facilitates real time applications. However, when using the approach in real life environment, it is noticed that the noise in the captured images can greatly affect the reconstruction quality. In this paper, we firstly analyze why the noisy fringe images can best be analyzed using the oriented 2D dual tree complex wavelet transform. We then suggest an effective yet simple method for enhancing the noisy fringe images. Both the simulation and experiment results show that the new approach can give good performance in reconstruction with fringe images even at high noise level.
URI: http://hdl.handle.net/10397/25611
ISBN: 978-1-4244-7992-4
978-1-4244-7993-1 (E-ISBN)
ISSN: 1522-4880
DOI: 10.1109/ICIP.2010.5653341
Appears in Collections:Conference Paper

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