Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/25544
Title: A physical analytical model of multilayer on-chip inductors
Authors: Tong, KY
Tsui, C
Keywords: Eddy currents
Inductor model
On-chip inductors
RF integrated circuits (ICs)
Issue Date: 2005
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE transactions on microwave theory and techniques, 2005, v. 53, no. 4 i, p. 1143-1148 How to cite?
Journal: IEEE transactions on microwave theory and techniques 
Abstract: An analytical model of multilayer on-chip inductors for CMOS integrated circuits based on physical principles has been developed. It provides accurate prediction of the self-resonant frequency, and eddy-current losses in the metal and Si substrate, as compared with experimental and numerical simulation results. The model includes improvements in the evaluation of eddy currents in metals caused by the proximity effect, and the equivalent capacitances in multilayer inductors. The Q factors deduced from the model agree well with experimental and numerical simulation results for multilayer inductors over a wide range of frequencies and widths of metal segments.
URI: http://hdl.handle.net/10397/25544
ISSN: 0018-9480 (print)
1557-9670 (online)
DOI: 10.1109/TMTT.2005.845721
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