Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/25516
DC FieldValueLanguage
dc.contributor.authorGuo, Zen_US
dc.contributor.authorZhang, Len_US
dc.contributor.authorZhang, Den_US
dc.date.accessioned2014-12-31T08:01:25Z-
dc.date.available2014-12-31T08:01:25Z-
dc.date.issued2010-
dc.identifier.citationIEEE transactions on image processing, 2010, v. 19, no. 6, 5427137, p. 1657-1663en_US
dc.identifier.issn1057-7149-
dc.identifier.urihttp://hdl.handle.net/10397/25516-
dc.description.abstractIn this correspondence, a completed modeling of the local binary pattern (LBP) operator is proposed and an associated completed LBP (CLBP) scheme is developed for texture classification. A local region is represented by its center pixel and a local difference sign-magnitude transform (LDSMT). The center pixels represent the image gray level and they are converted into a binary code, namely CLBP-Center (CLBP-C), by global thresholding. LDSMT decomposes the image local differences into two complementary components: The signs and the magnitudes, and two operators, namely CLBP-Sign (CLBP-S) and CLBP-Magnitude (CLBP-M), are proposed to code them. The traditional LBP is equivalent to the CLBP-S part of CLBP, and we show that CLBP-S preserves more information of the local structure than CLBP-M, which explains why the simple LBP operator can extract the texture features reasonably well. By combining CLBP-S, CLBP-M, and CLBP-C features into joint or hybrid distributions, significant improvement can be made for rotation invariant texture classification.en_US
dc.description.sponsorshipDepartment of Computingen_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.ispartofIEEE transactions on image processingen_US
dc.subjectLocal binary pattern (LBP)en_US
dc.subjectRotation invarianceen_US
dc.subjectTexture classificationen_US
dc.titleA completed modeling of local binary pattern operator for texture classificationen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1657-
dc.identifier.epage1663-
dc.identifier.volume19-
dc.identifier.issue6-
dc.identifier.doi10.1109/TIP.2010.2044957-
dc.identifier.isiWOS:000277773200023-
dc.identifier.scopus2-s2.0-77952607168-
dc.identifier.pmid20215079-
dc.identifier.eissn1941-0042-
dc.identifier.rosgroupidr47009-
dc.description.ros2009-2010 > Academic research: refereed > Publication in refereed journal-
Appears in Collections:Journal/Magazine Article
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

SCOPUSTM   
Citations

952
Last Week
8
Last month
9
Citations as of Nov 1, 2018

WEB OF SCIENCETM
Citations

764
Last Week
0
Last month
Citations as of Nov 12, 2018

Page view(s)

1,432
Last Week
27
Last month
Citations as of Nov 12, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.