Please use this identifier to cite or link to this item:
Title: Thick PZT films deposited on stainless steel substrates coated with barrier layers
Authors: Li, K
Lee, KW
Chan, HLW 
Choy, CL 
Keywords: Piezoelectric
Thick film
Issue Date: 2001
Publisher: Taylor & Francis Inc.
Source: Ferroelectrics, 2001, v. 252, no. 1-4, p. 461-467 How to cite?
Journal: Ferroelectrics 
Abstract: A mixture of lead zirconate titanate (PbZr 0.52Ti 0.48O 3, PZT) powder and PZT solution was deposited on a stainless steel substrate previously coated with a barrier layer to give a film of thickness 20-40 μm. A single layer of thickness 3 ∼ 5 μm could be prepared by using a mixture of 1.2 M PZT solution and PZT powder in a molar ratio of 1:1. Multiple layers were deposited in order to achieve the desired film thickness. The 4-6 μm thick barrier layer blocks the inter-diffusion of ions through the PZT/steel interface. X-ray diffraction measurements show that the film has a pure perovskite structure. The ferroelectric and piezoelectric properties of a 20 μm thick PZT film were measured.
Description: 6th International Simposium on Ferroic Domains and Mesoscopic Structures (ISFD-6), Nanjing, 29 May-2 June 2000
ISSN: 0015-0193
EISSN: 1563-5112
Appears in Collections:Journal/Magazine Article

View full-text via PolyU eLinks SFX Query
Show full item record


Last Week
Last month
Citations as of Aug 14, 2018

Page view(s)

Last Week
Last month
Citations as of Aug 19, 2018

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.