Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/25119
Title: Microwave dielectric properties of nanaocrystalline (Ba0.90Ca0.10) (Zr0.25Ti0.75) thin films epitaxially grown on (001) MgO single crystal substrates
Authors: Li, Q
Xiong, HF
Liu, QX
Tang, XG
Chan, HLW 
Keywords: (Ba, Ca)(Zr, Ti)O3 thin films
Epitaxially growth
Microwave dielectric properties
Plused laser deposition
Issue Date: 2008
Publisher: 中國學術期刊(光盤版)電子雜誌社
Source: 壓電與聲光 (Piezoelectrics & acoustooptics), 2008, v. 30, no. SUPPL., p. 56-58 How to cite?
Journal: 壓電與聲光 (Piezoelectrics & acoustooptics) 
Abstract: Highly oriented (Ba0.90Ca0.10) (Zr0.25Ti0.75)O3 (BCZT) thin films were grown on (001) MgO single crystal substrates using pulsed laser deposition and the microwave dielectric properties of the films were evaluated. The thin films were in situ annealed at 650°C for 10 min, the highly (001)-oriented BCZT thin films were obtained. The structure and surface morphology of the films had been characterized by X-ray diffraction (XRD) and atomic force microscopy (AFM). XRD and AFM characterization revealed a good crystallinity, the average size was about 70 nm and the root mean square (rms) roughness of the film surface was 10.8 nm. The microwave dielectric constants and dielectric tunabilities of the BCZT thin films were 167.9 and 18%, 162.2 and 18%, 153.8 and 17%, respectively at 150 MHz, 500 MHz, and 1 GHz and 13.3 MV/m.
URI: http://hdl.handle.net/10397/25119
ISSN: 1004-2474
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