Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/24723
Title: Structural and optical properties of (Pb0.72La 0.28)Ti0.93O3 thin films prepared by sol-gel process
Authors: Tang, XG
Chan, HLW 
Ding, AL
Issue Date: 2004
Publisher: Wiley-VCH
Source: Physica status solidi. A, Applied research, 2004, v. 201, no. 13, p. 2934-2940 How to cite?
Journal: Physica status solidi. A, Applied research 
Abstract: Nanocrystalline lead lanthanum titanate (Pbo0.72La 0.28Ti0.93O3 (PLT) thin films with grain size of 40-60 nm were grown on Pt/Ti/SiO2/Si(100) substrates by using a sol-gel method with rapid thermal annealing process. The spontaneous electrical polarization, remnant polarization and the coercive field are 11.9 μC/cm 2, 0.767 μC/cm2 and 9.38 kV/cm, respectively, for an electric field of 312 kV/cm. The refractive index n and extinction coefficient k of the nanocrystalline PLT thin film were obtained by spectro-scopic ellipsometry (SE) in the range of 370-1700 nm. At 633 nm, the refractive index n, and extinction coefficient k are 2.485, and 0.00546, respectively. For PLT films grown on fused quartz substrates annealed at 650°C, the direct band energy is found to be 3.75 eV.
URI: http://hdl.handle.net/10397/24723
ISSN: 0031-8965
EISSN: 1521-396X
DOI: 10.1002/pssa.200306865
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