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Title: The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study
Authors: Worsman, M
Wong, MWT
Lee, YS
Keywords: Analog circuits
Automatic testing
Built-in self-test
Circuit faults
Circuit testing
Design for testability
Fault diagnosis
System testing
Issue Date: 2001
Publisher: IEEE
Source: IEEE European Test Workshop, 2001, May 29 2001-June 1 2001, Stockholm, Sweden, p. 73-78 How to cite?
Abstract: Equivalence amongst the single and double catastrophic component faults of a potentiometric DAC under steadystate dc conditions is investigated. Easily identifiable equivalent faults are shown to populate the fault list in significant numbers. By facilitating a systematic testdesign approach focused on the prevention of equivalent fault conditions during test, equivalent fault analysis is used to greatly increase the percentage of catastrophic component faults diagnosable with a Built-In Self-Test (BIST) in [M.S. Nejad, L. Sebaa, A. Ladick, and H. Kuo, "Analog Built-In Self-Test," Proc. IEEE Int'l ASIC Conf and Exh., pp. 407-411, 1994]. The efect on analysis of component tolerances and other nonidealities is yet to be considered.
ISBN: 0-7695-1017-5
ISSN: 1530-1877
DOI: 10.1109/ETW.2001.946666
Appears in Collections:Conference Paper

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