Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/23822
Title: Electro-optic characterization of epitaxial Ba0.7Sr 0.3TiO3 thin films using prism coupling technique
Authors: Wang, DY
Li, S
Chan, HLW 
Choy, CL 
Keywords: BST thin films
Electro-optic
Prism coupling
Issue Date: 2011
Publisher: Elsevier
Source: Current applied physics, 2011, v. 11, no. 3 SUPPL., p. S52-S55 How to cite?
Journal: Current applied physics 
Abstract: In this work, we present our study on evaluating electro-optic properties of Ba0.7Sr0.3TiO3 thin films by prism coupling technique. Ferroelectric Ba0.7Sr0.3TiO3 thin films were epitaxially deposited on LaNiO3 electroded MgO (001) single-crystal substrates using pulsed laser deposition. Refractive indices and thickness of the Ba0.7Sr0.3TiO3 thin film were determined with a rutile prism (Metricon 200-P-2) under zero electric field at a wavelength of 632.8 nm. The angular shift of guided mode was observed subsequently with a conductive prism (Metricon 200-P-4aC) when electric field was applied to the thin film sample. The ordinary refractive index no changes 2.2% under a dc voltage of 4 V (E ∼ 11 V/μm). The linear electro-optic coefficient tensor r13 is thus calculated to be about 780 pm/V, showing the excellent potential of Ba0.7Sr 0.3TiO3 thin films for use in active optical devices.
URI: http://hdl.handle.net/10397/23822
ISSN: 1567-1739
DOI: 10.1016/j.cap.2010.09.014
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