Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/23086
Title: Dielectric properties and relaxation of SrBi2(Nb0.25Ta0.75)2 O9 ceramic at RF frequency
Authors: Liu, JZ
Kwok, KW 
Chan, HLW 
Choy, CL 
Keywords: Dielectric properties
Microwave applications
Relaxation
RF frequency
SrBi2(Nb0.25Ta0.75)2 O9 ceramic
Issue Date: 2004
Source: Journal of the European Ceramic Society, 2004, v. 24, no. 6, p. 1769-1773 How to cite?
Journal: Journal of the European Ceramic Society 
Abstract: The dielectric properties and relaxation of the SrBi2(Nb0.25Ta0.75)2 O9 ceramic were investigated from 3 to 300 MHz using frequency domain measurement by an impedance spectroscopy. Our results show that the dielectric relaxation of the ceramic can be understood in terms of power law dependence known as the Curie-von Schweidler law. It is assumed that defects, Schottkey jumps of electrons between localized states and the motions of ions play an important role in the dielectric properties and relaxation of the ceramic. The ceramic has large relative permittivity (εr ∼117 at 300 MHz), low dielectric loss (tanδe <0.018 at 300 MHz) and small dispersion (<3% decrease in εr from 3 to 300 MHz). The Curie temperature of the ceramic is very high (∼370 °C), implying that it has a small temperature coefficient. Hence the SrBi2(Nb0.25Ta0.75)2 O9 ceramic is a potential candidate for microwave applications.
URI: http://hdl.handle.net/10397/23086
ISSN: 0955-2219
DOI: 10.1016/S0955-2219(03)00540-5
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