Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/23081
Title: Barium strontium zirconate titanate (Ba,Sr)(Zr,Ti)O 3 thin films for tunable microwave applications
Authors: Chan, NY
Wang, Y 
Chan, HLW 
Keywords: (Ba
Sr)(Zr
Ti)O 3 thin film
Dielectric
Phase shifters
Ring resonators
Issue Date: 2011
Publisher: Taylor & Francis Inc.
Source: Ferroelectrics, 2011, v. 419, no. 1, p. 33-38 How to cite?
Journal: Ferroelectrics 
Abstract: (Ba 0.55Sr 0.45)(Zr 0.1Ti 0.9) O 3 (BSZT) thin films were deposited by pulsed laser deposition on LSAT(001) substrates. X-ray diffraction characterization reveals a good quality of crystallization and epitaxial nature of the films. The in-plane dielectric properties of the films were characterized over a wide frequency range from 50 MHz to 20 GHz by using ring resonator-structured samples. Based on the S-parameter measurements and electromagnetic simulation it was found that microwave dielectric constant of the BSZT thin film is ∼350. Large dielectric tunability was also observed in this material.
URI: http://hdl.handle.net/10397/23081
ISSN: 0015-0193
EISSN: 1563-5112
DOI: 10.1080/00150193.2011.594714
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