Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/22767
Title: Application of IDDQ test in failure analysis of micro-controller devices
Authors: Wong, MWT
Yu, AMF
Li, CK
Issue Date: 2001
Publisher: Elsevier
Source: Microelectronics journal, 2001, v. 32, no. 1, p. 29-34 How to cite?
Journal: Microelectronics journal 
Abstract: This paper presents a real case study on the testing of 8-bit mixed-signal CMOS micro-controller devices by applying the IDDQ testing methodology. The aim of the study is to evaluate the feasibility of using the IDDQ test to enhance the overall fault coverage. Failure analysis operated on the failed sample indicated a good correlation between the fault coverage and the parts that failed the IDDQ test.
URI: http://hdl.handle.net/10397/22767
ISSN: 0026-2692
DOI: 10.1016/S0026-2692(00)00075-6
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