Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/22744
Title: Thickness dependence of the coercive field in ferroelectric thin films
Authors: Hu, ZN
Lo, VC
Keywords: Coercive field
Ferroelectric thin film
Monte-Carlo simulation
Thickness
Issue Date: 2006
Publisher: World Scientific
Source: International journal of modern physics B, 2006, v. 20, no. 22, p. 3223-3231 How to cite?
Journal: International journal of modern physics B 
Abstract: By considering the effects of the space charges and domain boundaries in ferroelectric thin films, the thickness dependence of coercive field (E c) is numerically simulated based on the four-state Potts model with the nearest-neighbor interactions between dipole moments. For large thickness, experimental results where E c. decreases with thickness can be produced from our Monte-Carlo simulation. On the other hand, when the thickness is very small, our simulation gets that E c increases with thickness by the study of the polarization switching in the film. This gives an explanation of the experimental result by Zhu et al. in J. Appl. Phys. 83, 1 (1998) for SBT-BTN film, and a similar report by Bune et al. in Nature 391, 874 (1998) for the crystalline film. The critical temperature of the thin film is also discussed.
URI: http://hdl.handle.net/10397/22744
ISSN: 0217-9792
EISSN: 1793-6578
DOI: 10.1142/S0217979206035424
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