Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/22482
Title: A top-down feature mining framework for software product line
Authors: Tang, Y
Leung, H 
Keywords: Concept location
Feature mining
Software product line
Top-down framework
Variability
Issue Date: 2015
Publisher: SciTePress
Source: ICEIS 2015 - 17th International Conference on Enterprise Information Systems, Proceedings, 2015, v. 2, 7032733 How to cite?
Abstract: Software product line engineering is regarded as a promising approach to generate tailored software products by referencing shared software artefacts. However, converting software legacy into a product line is extremely difficult, given the complexity, risk of the task and insufficient tool support. To cope with this, in this paper, we proposed a top-down feature-mining framework to facilitate developers extracting code fragments for features concerned. Our work aims to fulfill the following targets: (1) identify features at a fine granularity, (2) locate code fragments for concerned feature hierarchically and consistently, and (3) combine program analysis techniques and feature location strategies to improve mining performance. From our preliminary case studies, the top-down framework can effectively locate features and performs as good as Christians approach and performs better than the topology feature location approach.
Description: 17th International Conference on Enterprise Information Systems, ICEIS 2015, 27-30 April 2015
URI: http://hdl.handle.net/10397/22482
ISBN: 9789897580963
Appears in Collections:Conference Paper

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