Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/22134
Title: Characterization of compositionally upgraded and downgraded Ba xSr1-xTiO3 thin films
Authors: Adikary, SU
Chan, HLW 
Keywords: BST
Compositional gradient
Ferroelectricity
Issue Date: 2002
Publisher: Taylor & Francis Inc.
Source: Ferroelectrics, 2002, v. 271, p. 277-282 How to cite?
Journal: Ferroelectrics 
Abstract: Compositionally upgraded and downgraded BaxSr1-xTiO 3 thin films were fabricated using a modified sol-gel technique. Both upgraded and downgraded BST thin films consist of perosvskite structure and the Ba and Sr compositional gradients were clearly observed in Rutherford backscattering (RBS) spectra. Film morphology was analysed by scanning electron microscopy and dielectric properties were measured as a function of frequency and temperature. Dielectric peaks were not observed in the temperature range from -20C to 120C. The values of remnant polarization (P r ) determined from the saturated P-E hysteresis loops were 3.52 μC/cm 2 and 4.13 μC/cm 2 for upgraded and downgraded films respectively.
URI: http://hdl.handle.net/10397/22134
ISSN: 0015-0193
EISSN: 1563-5112
DOI: 10.1080/00150190211509
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