Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/21514
Title: The order of transition of a ferroelectric thin film on a compliant substrate
Authors: Wang, B
Woo, CH 
Keywords: Compliant substrate
Ferroelectric film
Order of phase transition
Issue Date: 2004
Publisher: Pergamon-Elsevier Science Ltd
Source: Acta materialia, 2004, v. 52, no. 19, p. 5639-5644 How to cite?
Journal: Acta Materialia 
Abstract: The characteristics of ferroelectricity depend on a myriad of factors, including boundary conditions, sample dimensions, and misfit epitaxial stresses, etc. For this reason, ferroelectric thin films generally exhibit characteristics that may be substantially different from their bulk counterparts. Existent theoretical studies on ferroelectric thin films consider either free-standing films or films on rigid substrates. In this paper, films on compliant substrates are considered. Treating the para/ferro-electric transition as a point of instability of the time-dependent Ginzburg-Landau equation, the order of the transition is shown to depend sensitively on the relative thickness of the film and substrate. It is interesting that a critical thickness of the substrate can be found, above which the transition of a thin film of first-order bulk materials may become second-order.
URI: http://hdl.handle.net/10397/21514
ISSN: 1359-6454
DOI: 10.1016/j.actamat.2004.08.025
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