Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/21466
Title: Microtexture characterization of PZT ceramics and thin films by electron microscopy
Authors: Tai, CW
Baba-Kishi, KZ
Wong, KH
Keywords: Backscatter Kikuchi diffraction pattern
Crystallographic texture
Electron backscatter diffraction pattern
Ferroelectric ceramics
Ferroelectric thin films
Lead zirconate titanate
Issue Date: 2002
Publisher: Pergamon-Elsevier Science Ltd
Source: Micron, 2002, v. 33, no. 6, p. 581-586 How to cite?
Journal: Micron 
Abstract: Crystallographic orientations of lead zirconate titanate, Pb(Zrx,Ti1-x)O3 abbreviated PZT, were investigated by the technique of electron backscatter diffraction pattern (EBSP) in the scanning electron microscope (SEM). The samples included unpoled and poled ceramics and a thin film. Several hundreds of crystal orientations in the bulk ceramics and thin films were examined by EBSP and the results were plotted in microtexture pole- and inverse pole-figures for determination of the average and local preferred orientations. In addition, local textures in certain selected regions in PZT ceramics and the misorientations between the nearest neighboring grains were also determined.
URI: http://hdl.handle.net/10397/21466
ISSN: 0968-4328
DOI: 10.1016/S0968-4328(02)00016-1
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