Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/21262
Title: Generalized cross validation for multiwavelet shrinkage
Authors: Hsung, TC
Lun, PK 
Issue Date: 2004
Source: IEEE signal processing letters, 2004, v. 11, no. 6, p. 549-552
Abstract: Traditional multiwavelet shrinkage denoising techniques require a priori knowledge of noise variance that may not be obtained in some practical situations. By using generalized cross validation (GCV), we propose in this paper a new level-dependent risk estimator for multiwavelet shrinkage that does not require such a priori information. Simulation results verify that the resulted risk estimator gives better indication on threshold selection comparing with the traditional GCV method. Improved denoising performance is then achieved particularly for higher multiplicity multiwavelet shrinkage.
Keywords: Multiwavelet
Parameter estimation
Smoothing methods
Wavelet transforms
White noise
Publisher: Institute of Electrical and Electronics Engineers
Journal: IEEE signal processing letters 
ISSN: 1070-9908
EISSN: 1558-2361
DOI: 10.1109/LSP.2004.827924
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

9
Last Week
0
Last month
0
Citations as of Sep 6, 2020

WEB OF SCIENCETM
Citations

3
Last Week
0
Last month
0
Citations as of Sep 25, 2020

Page view(s)

154
Last Week
6
Last month
Citations as of Sep 20, 2020

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.