Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/21262
Title: Generalized cross validation for multiwavelet shrinkage
Authors: Hsung, TC
Lun, PK 
Keywords: Multiwavelet
Parameter estimation
Smoothing methods
Wavelet transforms
White noise
Issue Date: 2004
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE signal processing letters, 2004, v. 11, no. 6, p. 549-552 How to cite?
Journal: IEEE signal processing letters 
Abstract: Traditional multiwavelet shrinkage denoising techniques require a priori knowledge of noise variance that may not be obtained in some practical situations. By using generalized cross validation (GCV), we propose in this paper a new level-dependent risk estimator for multiwavelet shrinkage that does not require such a priori information. Simulation results verify that the resulted risk estimator gives better indication on threshold selection comparing with the traditional GCV method. Improved denoising performance is then achieved particularly for higher multiplicity multiwavelet shrinkage.
URI: http://hdl.handle.net/10397/21262
ISSN: 1070-9908
EISSN: 1558-2361
DOI: 10.1109/LSP.2004.827924
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