Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/21039
Title: Distance metric learning by knowledge embedding
Authors: Zhang, YG
Zhang, CS
Zhang, D 
Keywords: Clustering
Distance metric learning
Knowledge embedding
Issue Date: 2004
Publisher: Elsevier
Source: Pattern recognition, 2004, v. 37, no. 1, p. 161-163 How to cite?
Journal: Pattern recognition 
Abstract: This paper presents an algorithm which learns a distance metric from a data set by knowledge embedding and uses the new distance metric to solve nonlinear pattern recognition problems such a clustering.
URI: http://hdl.handle.net/10397/21039
ISSN: 0031-3203
EISSN: 1873-5142
DOI: 10.1016/S0031-3203(03)00218-8
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