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Title: Enhancing the static D.C. fault diagnosis of a Resistance Temperature Detector sensor circuit using equivalent fault analysis
Authors: Worsman, M
Wong, MWT
Lee, YS
Issue Date: 2002
Source: The First IEEE International Workshop on Electronic Design, Test and Applications, 2002 : proceedings : January 2002, Christchurch, p. 443-446
Abstract: Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes
Keywords: Fault diagnosis
Temperature sensors
Tolerance analysis
Publisher: IEEE
ISBN: 0-7695-1453-7
DOI: 10.1109/DELTA.2002.994669
Appears in Collections:Conference Paper

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