Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/20542
Title: Thickness dependence of susceptibility and phase transition temperature in ferroelectric thin films
Authors: Lo, VC
Li, KT
Issue Date: 2007
Publisher: Wiley-V C H Verlag Gmbh
Source: Physica status solidi (b) basic research, 2007, v. 244, no. 2, p. 783-793 How to cite?
Journal: Physica Status Solidi (B) Basic Research 
Abstract: The thickness dependence of the susceptibility and paraelectric- ferroelectric phase transition temperature in ferroelectric thin films has been numerically simulated using Landau-Khalatnikov theory. This dependence is attributed to the presence of a surface layer near the electrode/film interface. In the presence of interfacial strain, the surface layer exhibits different ferroelectric properties compared with those inside the film. The thickness dependence of coercive field and remanent polarization has been successfully simulated before by considering the presence of this surface layer [V. C. Lo, J. Appl. Phys. 94, 3353 (2003)]. Based on the same model, the experimental trends in the thickness dependence of susceptibility and phase transition temperature can be reproduced.
URI: http://hdl.handle.net/10397/20542
DOI: 10.1002/pssb.200642302
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