Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/19687
Title: Molecular dynamics simulation of dealloyed layer-enhanced dislocation emission and crack propagation
Authors: Li, QK
Zhang, Y
Shi, SQ 
Chu, WY
Keywords: Crack extension
Dealloying layer
Dislocation emission
Molecular dynamics simulation
Issue Date: 2002
Publisher: North-Holland
Source: Materials letters, 2002, v. 56, no. 6, p. 927-932 How to cite?
Journal: Materials letters 
Abstract: Three-dimensions molecular dynamics (MD) method by employing the embedded atom method (EAM) potential is used to simulate the effect of stress corrosion-induced dealloyed layer existed on the surface of a crack of Cu2Au alloy on dislocation emission and crack propagation. The simulations show that the existence of a dealloyed layer enhances dislocation emission and crack propagation, i.e., decreases the critical stress intensity for dislocation emission from KIe = 0.62 MPam1/2 to KIe* = 0.556 MPam1/2 and that for crack propagating after emitting large amounts of dislocations from KIP = 1.14 MPam1/2 to KIP* = 1.06 MPam1/2. This indicates that dealloyed layer-induced tensile stress can help the applied stress to enhance dislocation emission and crack extension.
URI: http://hdl.handle.net/10397/19687
ISSN: 0167-577X
EISSN: 1873-4979
DOI: 10.1016/S0167-577X(02)00639-0
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