Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/19394
Title: Meta-Cure : a reliability enhancement strategy for metadata in NAND flash memory storage systems
Authors: Wang, YI
Bathen, LAD
Dutt, N
Shao, Z 
Keywords: ECC
NAND flash memory
Metadata
Redundancy
Reliability
Issue Date: 2012
Publisher: IEEE
Source: 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC), 3-7 June 2012, San Francisco, CA, p. 214-219 How to cite?
Journal: 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC), 3-7 June 2012, San Francisco, CA 
Abstract: The increasing density of NAND flash memory leads to a dramatic increase in the bit error rate of flash, which greatly reduces the ability of error correcting codes (ECC) to handle multi-bit errors. To ensure the functionality and reliability of flash memory, the pages containing address mapping information and other metadata should be carefully stored in flash memory. This paper presents Meta-Cure, a novel hardware and file system interface that transparently protects metadata in the presence of multi-bit faults. Meta-Cure exploits built-in ECC and replication in order to protect pages containing critical data. Redundant pairs are formed at run time and distributed to different physical pages to protect against failures. Meta-Cure requires no changes to the file system, on-chip hierarchy, or hardware implementation of flash memory chip. Experimental results show that the proposed technique can reduce uncorrectable page errors by 92% with less than 1% space overhead in comparison with conventional error correction techniques.
URI: http://hdl.handle.net/10397/19394
ISBN: 978-1-4503-1199-1
ISSN: 0738-100X
Appears in Collections:Conference Paper

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