Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/19200
Title: Hydrogen-induced failure in ZnO multilayer ceramic chip varistors with a zinc phosphate passivation layer
Authors: Chen, WP
Zhu, K
Wang, Y 
Chan, HLW 
Wu, J
Ye, CH
Issue Date: 2008
Publisher: Wiley-Blackwell
Source: Journal of the American Ceramic Society, 2008, v. 91, no. 6, p. 2064-2066 How to cite?
Journal: Journal of the American Ceramic Society 
Abstract: Zinc oxide multilayer ceramic chip varistors (MLVs) with a zinc phosphate passivation layer were studied using electrochemical hydrogen charging, in which hydrogen was deposited on the termination electrodes of MLVs through the electrolysis of water in 0.01m NaOH solution. The properties of the MLVs remained stable during the first stage of electrochemical hydrogen charging, except that the capacitance was increased slightly. Then a second stage appeared in which the properties of the MLVs were quickly and greatly degraded. The zinc phosphate passivation layer was found to be responsible for producing the first stable stage of electrochemical hydrogen charging. A passivation layer is of great importance to prevent hydrogen-induced failure for MLVs in service.
URI: http://hdl.handle.net/10397/19200
ISSN: 0002-7820
EISSN: 1551-2916
DOI: 10.1111/j.1551-2916.2008.02378.x
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