Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/19111
Title: Arbitrarily oriented crack near interface in piezoelectric bimaterials
Authors: Tian, W
Chau, KT 
Keywords: Crack
Dislocation
Interface
J-integral
Piezoelectric bimaterials
Issue Date: 2003
Publisher: Pergamon Press
Source: International journal of solids and structures, 2003, v. 40, no. 8, p. 1943-1958 How to cite?
Journal: International journal of solids and structures 
Abstract: Arbitrarily oriented crack near interface in piezoelectric bimaterials is considered. After deriving the fundamental solution for an edge dislocation near the interface, the present problem can be expressed as a system of singular integral equations by modeling the crack as continuously distributed edge dislocations. In the paper, the dislocations are described by a density function defined on the crack line. By solving the singular integral equations numerically, the dislocation density function is determined. Then, the stress intensity factors (SIFs) and the electric displacement intensity factor (EDIF) at the crack tips are evaluated. Subsequently, the influences of the interface on crack tip SIFs, EDIF, and the mechanical strain energy release rate (MSERR) are investigated. The J-integral analysis in piezoelectric bimaterals is also performed. It is found that the path-independent of J1-integral and the path-dependent of J2-integral found in no-piezoelectric bimaterials are still valid in piezoelectric bimaterials.
URI: http://hdl.handle.net/10397/19111
ISSN: 0020-7683
EISSN: 1879-2146
DOI: 10.1016/S0020-7683(02)00493-6
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