Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/18843
Title: Hopf bifurcation in the Hodgkin-Huxley model exposed to ELF electrical field
Authors: Wang, J
Tsang, KM 
Zhang, H
Issue Date: 2004
Publisher: Pergamon Press
Source: Chaos, solitons and fractals, 2004, v. 20, no. 4, p. 759-764 How to cite?
Journal: Chaos, solitons and fractals 
Abstract: This paper discussed the interference between external electric exposure and biological objects. Based on results of space-time characteristics of trans-membrane voltage, the variation of cell trans-membrane voltage exposed to extremely low frequency (ELF) electrical field was analyzed; the traditional Hodgkin-Huxley model was modified by importing new parameter denoting external electrical fields, and the bifurcation caused by new parameter war found. This paper employed the algebra criterion in high dimension equations to perform the analysis of single parameter dynamical bifurcation. The results were biological significant and suggested that the aberration of dynamics in bio-systems may be accounted for diseases caused by electric exposure.
URI: http://hdl.handle.net/10397/18843
ISSN: 0960-0779
EISSN: 1873-2887
DOI: 10.1016/j.chaos.2003.08.011
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