Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/18592
Title: Effect of strain on the ferroelectric properties in epitaxial perovskite titanate thin films grown on ferromagnetic CoFe2O4 layers
Authors: Huang, W
Zhu, J
Zeng, HZ
Wei, XH
Zhang, Y
Li, YR
Hao, JH 
Keywords: Ferroelectric properties
Ferromagnetic films
Heteroepitaxy
Strain
Issue Date: 2008
Publisher: Pergamon Press
Source: Scripta materialia, 2008, v. 58, no. 12, p. 1118-1120 How to cite?
Journal: Scripta materialia 
Abstract: A BaTiO3/CoFe2O4 heterostructure was fabricated by laser molecular beam epitaxy. The effects of strain on the microstructures, domain morphologies and ferroelectric properties of BaTiO3 thin films were studied systematically. Ferroelectric properties in a 40-nm-thick BaTiO3 film were suppressed owing to a reduced tetragonality induced by the strain between BaTiO3 and the underlying CoFe2O4. For a 100-nm-thick film, BaTiO3 exhibits improved the ferroelectric properties with an out-of-plane polarization (2Pr) of 36.4 μC cm-2 and an electric coercivity field of 104 kV cm-1. The results show that the thickness of BaTiO3 can significantly affect the interfacial strain and hence the ferroelectric properties of the BaTiO3/CoFe2O4 heterostructure.
URI: http://hdl.handle.net/10397/18592
ISSN: 1359-6462
EISSN: 1872-8456
DOI: 10.1016/j.scriptamat.2008.02.009
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