Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/18592
Title: Effect of strain on the ferroelectric properties in epitaxial perovskite titanate thin films grown on ferromagnetic CoFe2O4 layers
Authors: Huang, W
Zhu, J
Zeng, HZ
Wei, XH
Zhang, Y
Li, YR
Hao, JH 
Issue Date: 2008
Source: Scripta materialia, 2008, v. 58, no. 12, p. 1118-1120
Abstract: A BaTiO3/CoFe2O4 heterostructure was fabricated by laser molecular beam epitaxy. The effects of strain on the microstructures, domain morphologies and ferroelectric properties of BaTiO3 thin films were studied systematically. Ferroelectric properties in a 40-nm-thick BaTiO3 film were suppressed owing to a reduced tetragonality induced by the strain between BaTiO3 and the underlying CoFe2O4. For a 100-nm-thick film, BaTiO3 exhibits improved the ferroelectric properties with an out-of-plane polarization (2Pr) of 36.4 μC cm-2 and an electric coercivity field of 104 kV cm-1. The results show that the thickness of BaTiO3 can significantly affect the interfacial strain and hence the ferroelectric properties of the BaTiO3/CoFe2O4 heterostructure.
Keywords: Ferroelectric properties
Ferromagnetic films
Heteroepitaxy
Strain
Publisher: Pergamon Press
Journal: Scripta materialia 
ISSN: 1359-6462
EISSN: 1872-8456
DOI: 10.1016/j.scriptamat.2008.02.009
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

10
Last Week
0
Last month
0
Citations as of Sep 6, 2020

WEB OF SCIENCETM
Citations

10
Last Week
0
Last month
0
Citations as of Sep 19, 2020

Page view(s)

164
Last Week
1
Last month
Citations as of Sep 20, 2020

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.