Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/18532
Title: Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications
Authors: Choy, SH
Wang, DY
Dai, JY 
Chan, HLW 
Choy, CL 
Keywords: BSZT thin films
Coefficient
Electro-optic
Prism coupler
Pulsed laser deposition
Issue Date: 2006
Publisher: Taylor & Francis
Source: Integrated ferroelectrics, 2006, v. 80, no. 1, p. 107-114 How to cite?
Journal: Integrated ferroelectrics 
Abstract: Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.
URI: http://hdl.handle.net/10397/18532
ISSN: 1058-4587
EISSN: 1607-8489
DOI: 10.1080/10584580600656601
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