Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/18355
Title: Second-level partition for estimating far confidence intervals in biometric systems
Authors: Li, R
Tang, D
Li, W
Zhang, D 
Keywords: Biometric
Bootstrap
Confidence interval
Performance evaluation
Issue Date: 2009
Publisher: Springer
Source: Lecture notes in computer science (including subseries Lecture notes in artificial intelligence and lecture notes in bioinformatics), 2009, v. 5702 LNCS, p. 58-65 How to cite?
Journal: Lecture notes in computer science (including subseries Lecture notes in artificial intelligence and lecture notes in bioinformatics) 
Abstract: Most biometric authentication algorithms make use of a similarity score that defines how similar two templates are according to a threshold and the accuracy of the results are expressed in terms of a False Reject Rate (FRR) or False Accept Rate (FAR) that is estimated using the training data set. A confidence interval is assigned to any claim of accuracy with 90% being commonly assumed for biometric-based authentication systems. However, these confidence intervals may not be as accurate as is presumed. In this paper, we report the results of experiments measuring the performance of the widely-used subset bootstrap approach to estimating the confidence interval of FAR. We find that the coverage of the FAR confidence intervals estimated by the subset bootstrap approach is reduced by the dependence between two similarities when they come from two individual pairs shared with a common individual. This is because subset bootstrap requires the independence of different subsets. To deal with this, we present a second-level partition to the similarity score set between different individuals, producing what we call a subset false accept rate (SFAR) bootstrap estimation. The experimental results show that the proposed procedures greatly increase the coverage of the FAR confidence intervals.
Description: 13th International Conference on Computer Analysis of Images and Patterns, CAIP 2009, Munster, 2-4 September 2009
URI: http://hdl.handle.net/10397/18355
ISBN: 3642037666
9783642037665
ISSN: 0302-9743
EISSN: 1611-3349
DOI: 10.1007/978-3-642-03767-2_7
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