Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/18202
Title: Compositional dependence of structure and dielectric properties in Ba(ZrxTi1-x)O3 thin films grown by pulsed laser deposition
Authors: Yun, P
Wang, DY
Wang, Y 
Chan, HLW 
Keywords: Barium zirconate titanate
Thin films
Tunable
Zr/Ti ratio
Issue Date: 2009
Publisher: Taylor & Francis Inc.
Source: Ferroelectrics, 2009, v. 387, no. 1 PART 1, p. 63-69 How to cite?
Journal: Ferroelectrics 
Abstract: Ba(ZrxTi1- x)O3 (BZT) thin films with various compositions (x = 0.20, 0.25, 0.30, 0.35) were epitaxially grown on (LaAlO3)0.3(Sr2AlTaO6)0.35 [LSAT] (001) single crystal substrates using pulsed laser deposition. By x-ray diffraction measurements it was found that all the films exhibited a tetragonally distorted lattice structure, which is different from that of the constituent ceramics. Consequently, an upward shifted Curie temperature was observed in each of the films. The in-plane dielectric properties were determined. At room temperature, a large dielectric tunabilities of 50% (at 500 MHz) was achieved at x = 0.30, showing its potential for use in tunable microwave devices.
Description: 5th International Conference on Microwave Materials and their Applications, MMA-2008, Hangzhou, 4-8 November 2008
URI: http://hdl.handle.net/10397/18202
ISSN: 0015-0193
EISSN: 1563-5112
DOI: 10.1080/00150190902966354
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