Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/17644
Title: Lifetime estimation of high-power white LED using degradation-data-driven method
Authors: Fan, J
Yung, KC 
Pecht, M
Keywords: Degradation-data-driven method (DDDM)
high-power white light-emitting diode (HPWLED)
lifetime estimation
reliability
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE transactions on device and materials reliability, 2012, v. 12, no. 2, 6166442, p. 470-477 How to cite?
Journal: IEEE transactions on device and materials reliability 
Abstract: High-power white light-emitting diodes (HPWLEDs) have attracted much attention in the lighting market. However, as one of the highly reliable electronic products which may be not likely to fail under the traditional life test or even accelerated life test, HPWLED's lifetime is difficult to estimate by using traditional reliability assessment techniques. In this paper, the degradation-data-driven method (DDDM), which is based on the general degradation path model, was used to predict the reliability of HPWLED through analyzing the lumen maintenance data collected from the IES LM-80-08 lumen maintenance test standard. The final predicted results showed that much more reliability information (e.g., mean time to failure, confidence interval, reliability function, and so on) and more accurate prediction results could be obtained by DDDM including the approximation method, the analytical method, and the two-stage method compared to the IES TM-21-11 lumen lifetime estimation method. Among all these three methods, the two-stage method produced the highest prediction accuracy.
URI: http://hdl.handle.net/10397/17644
ISSN: 1530-4388 (print)
1558-2574 (online)
DOI: 10.1109/TDMR.2012.2190415
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