Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/17625
Title: Hydrogen-induced degradation and aging of Pb(Mg1/3Nb 2/3)O3-based X7R multilayer ceramic capacitors
Authors: Yao, WQ
Chen, WP
Shen, ZJ
Yu, XL
Hu, YM
Wang, Y 
Chan, HLW 
Keywords: Aging
Capacitor
Ceramic
Degradation
Hydrogen
Pb(Mg1/3Nb2/3)O3
Reliability
Issue Date: 2008
Source: Japanese journal of applied physics, 2008, v. 47, no. 7 PART 1, p. 5530-5533 How to cite?
Journal: Japanese Journal of Applied Physics 
Abstract: Pb(Mg1/3Nb2/3)O3-based X7R multilayer ceramic capacitors (MLCs) were placed in 0.01 M NaOH solution to deposit hydrogen on their termination electrodes through the electrolysis of water. The treatment led to great increases in the dielectric loss and the leakage current of the MLCs, and the dielectric properties of the MLCs also showed a strong aging behavior, with the capacitance and dielectric loss first inceased, and then gradually decreased. It was proposed that hydrogen from the electrolysis of water entered into Pb(Mg1/3Nb2/3)O3 lattice and existed at interstial lattice sites. The observed degradation could be explained by free electrons formed through ionization of interstitial hydrogen. Hydrogen-induced degradation happens in Pb(Mg1/3Nb 2/3)O3-based MLCs during electroplating and in service and much attention should be paid to prevent hydrogen-induced degradation in them.
URI: http://hdl.handle.net/10397/17625
ISSN: 0021-4922
DOI: 10.1143/JJAP.47.5530
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