Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/17561
Title: Planar dielectric properties of compositionally-graded (Ba1-xSrx)TiO3 thin films prepared by pulsed-laser deposition
Authors: Zhu, XH
Chan, HLW 
Choy, CL
Wong, KH
Keywords: Planar dielectric properties
Compositionally-graded films
(Ba1-xSrx)TiO3
Pulsed-laser deposition
Issue Date: 2002
Publisher: Taylor & Francis
Source: Integrated ferroelectrics, 2002, v. 45, p. 151-158 How to cite?
Journal: Integrated ferroelectrics 
Abstract: Compositionally-graded (Ba1-xSrx)TiO3 (BST) (x:0.0-0.25) thin films with composition gradients normal to the substrate were epitaxially grown on (100)-oriented MgO substrates at 700degreesC by pulsed-laser deposition. The planar dielectric properties of the epitaxial graded BST films were measured by using surface interdigital electrodes as a function of frequency, temperature and dc applied voltage. The results show that at room temperature, the dielectric constant of the graded BST film was about 450 with a dielectric loss, tandelta of 0.007 at 100 kHz. The graded BST films also exhibit a broad and flat profile of the dielectric constant versus temperature. Such dielectric response of the graded structure is attributed to the presence of the compositional and/or residual strain gradients in the epitaxial graded films. Measurements varying the dc bias voltage showed hysteresis of the dielectric response and a tunability of 25% at an applied electric field of 80 kV/cm.
Description: 14th International Symposium on Integrated Ferroelectrics/13th IEEE Int Symposium on the Applications of Ferroelectrics/19th Meeting on Ferroelectric Mat and their Applicat, Nara, Japan, 28 May- 1 June 2002
URI: http://hdl.handle.net/10397/17561
ISSN: 1058-4587
EISSN: 1607-8489
DOI: 10.1080/10584580190044056
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