Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/17472
Title: A generic system monitoring technique by using similarity recognition on the flowing entity pattern
Authors: Tang, CS
Chan, CY
Yung, KL 
Keywords: Computer integrated manufacturing
Control charts
Manufacturing systems
Process monitoring
Statistical process control
Issue Date: 2007
Publisher: IEEE
Source: Third International Conference on Natural Computation, 2007 : ICNC 2007, 24-27 August 2007, Haikou, p. 389-393 How to cite?
Abstract: Normally, statistic process control (SPC) techniques are applied in monitoring production activities in a manufacturing system. With the help of the computer integrated manufacturing (CIM), the efficiency of data transmission has improved. To examine the fluctuations on a control chart, the SPC tools provide a good platform. However, they are often too dedicated to a specific system type as SPC tools usually devote in well-known parameters such as the dimensions of a work piece, the temperature of an operation process, etc. In this paper, an alternative method is proposed. It is about the studying of the physical entities flowing patterns in a system to obtain an overview of a system instead of measuring specific parameters. This generic monitoring technique can potentially be applied not only in manufacturing systems but any system which contains measurable physical element flows.
URI: http://hdl.handle.net/10397/17472
ISBN: 978-0-7695-2875-5
DOI: 10.1109/ICNC.2007.33
Appears in Collections:Conference Paper

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