Please use this identifier to cite or link to this item:
Title: A generic system monitoring technique by using similarity recognition on the flowing entity pattern
Authors: Tang, CS
Chan, CY
Yung, KL 
Keywords: Computer integrated manufacturing
Control charts
Manufacturing systems
Process monitoring
Statistical process control
Issue Date: 2007
Publisher: IEEE
Source: Third International Conference on Natural Computation, 2007 : ICNC 2007, 24-27 August 2007, Haikou, p. 389-393 How to cite?
Abstract: Normally, statistic process control (SPC) techniques are applied in monitoring production activities in a manufacturing system. With the help of the computer integrated manufacturing (CIM), the efficiency of data transmission has improved. To examine the fluctuations on a control chart, the SPC tools provide a good platform. However, they are often too dedicated to a specific system type as SPC tools usually devote in well-known parameters such as the dimensions of a work piece, the temperature of an operation process, etc. In this paper, an alternative method is proposed. It is about the studying of the physical entities flowing patterns in a system to obtain an overview of a system instead of measuring specific parameters. This generic monitoring technique can potentially be applied not only in manufacturing systems but any system which contains measurable physical element flows.
ISBN: 978-0-7695-2875-5
DOI: 10.1109/ICNC.2007.33
Appears in Collections:Conference Paper

View full-text via PolyU eLinks SFX Query
Show full item record

Page view(s)

Last Week
Last month
Citations as of Aug 13, 2018

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.