Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/17449
Title: An intelligent model for detecting and classifying color-textured fabric defects using genetic algorithms and the elman neural network
Authors: Zhang, YH
Yuen, CWM
Wong, WK 
Kan, CW 
Keywords: color ring-projection classification
Elman neural network
fabric defect detection
genetic algorithm
Issue Date: 2011
Publisher: SAGE Publications
Source: Textile research journal, 2011, v. 81, no. 17, p. 1772-1787 How to cite?
Journal: Textile research journal 
Abstract: In this paper, an intelligent color-textured fabric defect detection and classification model using genetic algorithms and the Elman neural network is introduced. A color ring projection is used for image processing, and the solution for optimization of parameters is based on the genetic algorithm method. The new modified Elman network is proposed to classify the type of fabric defects, which have proportional, integral, and derivative properties. The proposed inspecting model in this study is more feasible and applicable in fabric and stitching garment defect detection and classification.
URI: http://hdl.handle.net/10397/17449
ISSN: 0040-5175
EISSN: 1746-7748
DOI: 10.1177/0040517511410102
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

11
Last Week
0
Last month
0
Citations as of Jul 28, 2017

WEB OF SCIENCETM
Citations

8
Last Week
0
Last month
1
Citations as of Aug 13, 2017

Page view(s)

42
Last Week
4
Last month
Checked on Aug 14, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.