Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/17398
Title: Epitaxial growth and rectification characteristics of double perovskite oxide La2NiMnO6 films on Nb-SrTiO3 single crystal substrates
Authors: Gao, GY
Wang, Y 
Jiang, Y
Fei, LF
Chan, NY
Chan, HLW 
Wu, WB
Keywords: Double perovskite
Epitaxial growth
pn junctions
Pulsed laser deposition
Rectifying behavior
Thin films
Issue Date: 2011
Publisher: Elsevier
Source: Thin solid films, 2011, v. 519, no. 18, p. 6148-6150 How to cite?
Journal: Thin solid films 
Abstract: High-quality thin films of double perovskite La2NiMnO 6 (LNMO) were epitaxially grown on Nb-doped SrTiO3 (NSTO) substrates by pulsed laser deposition. The films were found to undergo a ferromagnetic-to-paramagnetic transition at ∼ 280 K, which is consistent with the literature report. In the electrical measurements, typical rectifying behavior was observed in the LNMO/NSTO heterojunction. The diffusion voltage (VD) increases linearly with temperature (T) during cooling until T = 170 K. At T < 170 K, VD increases at a higher rate and the V D-T relationship becomes non-linear. A disordered phase related spin polarization was used to understand such behaviors in the heterojunctions.
URI: http://hdl.handle.net/10397/17398
ISSN: 0040-6090
EISSN: 1879-2731
DOI: 10.1016/j.tsf.2011.03.137
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