Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/16942
Title: Investigation of polarization fatigue induced deep level transient spectroscopy in lead zirconate titanate thin film
Authors: Lo, VC
Li, KT
Issue Date: 2007
Publisher: Springer
Source: Journal of materials science : materials in electronics, 2007, v. 18, no. 5, p. 553-557 How to cite?
Journal: Journal of materials science : materials in electronics 
Abstract: Deep level transient spectroscopy (DLTS) in pulsed laser deposited lead zirconate titanate (Pb(Zr 0.52Ti 0.48)O 3 thin film grown on LSCO (La 0.5Sr 0.5)O 3 bottom electrode and LaAlO 3 substrate has been investigated. The transient capacitance and the deep level energy inside the energy band gap are correlated with the number of bipolar switching cycles. It was found that both of them increase with the number of switching cycles.
URI: http://hdl.handle.net/10397/16942
ISSN: 0957-4522
EISSN: 1573-482X
DOI: 10.1007/s10854-006-9070-y
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